Semiconductor device and capacitor with means to prevent deterioration due to hydrogen

ABSTRACT

There is provided a semiconductor device including (a) a semiconductor substrate, (b) a capacity device, (c) an interlayer insulating layer formed between the semiconductor substrate and the capacity device for electrically isolating them with each other, the interlayer insulating layer being formed below the capacity device with a contact hole therethrough, (d) a contact plug composed of an electrically conductive material and formed in the contact hole, (e) a first film composed of a first material through which hydrogen is not allowed to pass, and formed between the interlayer insulating layer and capacity device, (f) a second film composed of a second material through which hydrogen is not allowed to pass, and formed on an inner wall of the contact hole, (g) a third film composed of a third material through which hydrogen is not allowed to pass, and formed to cover an upper surface of the capacity device therewith, and (h) a fourth film composed of a fourth material through which hydrogen is not allowed to pass, and formed to cover a side surface of the capacity device therewith. The first, second, third, and fourth materials are silicon nitride, for instance. Since a capacity device having a capacitive film composed of metal oxide readily reduced by hydrogen is entirely covered with first to fourth films, which are composed of silicon nitride, for instance, it is possible to avoid the capacitive film from being reduced, which ensures that the capacitive film is not deteriorated.

CROSS REFERENCE TO RELATED APPLICATIONS

This application is a divisional of U.S. Pat. application Ser. No.09/134,394 filed Aug. 14, 1998, now U.S. Pat. No. 6,121,083.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The invention relates to a semiconductor device and a method offabricating the same.

2. Description of the Related Art

In these days, a semiconductor memory device has been required tooperate at a higher rate, have a greater capacity for storing datatherein, and operate in less power consumption. To such requirements,there has been suggested a dynamic random access memory (DRAM), which ismuch in demand now, having a capacitive or insulating film of a capacitydevice or a memory node which film is composed of metal oxides having agreater dielectric constant than that of a silicon dioxide film in orderto make it possible to form memory cells in a circuit smaller. Some ofsuch metal oxides are ferroelectric. There has been also suggested anon-volatile memory utilizing ferroelectric characteristics of thosemetal oxides.

Japanese Unexamined Patent Publication No. 7-38068 published on Feb. 7,1995 has suggested a semiconductor memory device having a capacitivefilm composed of high-dielectric substance. FIG. 1 illustrates thesuggested semiconductor memory device.

LOCOS oxide films 803 are formed at a surface of a silicon substrate 801to thereby define a device formation region therein. Below LOCOS films803 are formed channel stopper regions 804. Source/drain regions 802 areformed at a surface of the silicon substrate 801. Gate electrodes 805acting as word lines are formed on LOCOS oxide films. A signal line 806acting as a bit line is formed on the silicon substrate 801 between thesource/drain regions 802.

An interlayer insulating film consisting of a silicon dioxide film 807and a silicon nitride film 808 is formed on the silicon substrate 801.The interlayer insulating film is formed therethrough with contact holes809 reaching the source/drain regions 802. Each of the contact holes 809is filled with a plug 810 composed of an electrically conductivematerial such as metal.

A capacity device having a capacitive film composed of high-dielectricsubstance is formed on the interlayer insulating film. The capacitydevice is in electrical connection with the source/drain regions 802through the plug 810. The silicon nitride film 808 and the plug 810 areboth planarized at the same level.

The capacity device is comprised of a plurality of lower or storageelectrodes 811, a capacitive insulating film 812 entirely covering thelower electrodes 811 therewith, and an upper or plate electrode 813deposited all over the capacitive insulating film 812.

Over the upper electrode 813 are formed a metal wiring layer (notillustrated), and an interlayer insulating film 814 for electricallyinsulating the metal wiring layer and the upper electrode 813 with eachother, to thereby constitute a semiconductor memory device.

After the metal wiring layer has been formed, the product is thermallyannealed in hydrogen atmosphere in order to reduce a dispersion in athreshold voltage of transistors arranged on a surface of the siliconsubstrate, and a dispersion in a current for driving transistors. Thisthermal annealing compensates for defects, such as a trap level, formedat an interface between the capacity device and the interlayerinsulating film making contact with the capacity device.

However, the above-mentioned semiconductor memory device illustrated inFIG. 1 has shortcomings as follows.

First, since the thermal annealing in hydrogen atmosphere is carried outafter the capacity device has been formed, the capacitive film composedof metal oxide is unpreferably reduced with the result of deteriorationof capacitive characteristics of the capacity device.

Secondly, transistors formed on layers located below a layer on whichthe capacity device is formed may be deteriorated with respect toperformance and reliability thereof. Specifically, as illustrated inFIG. 1, since the silicon nitride film 808 entirely covers the silicondioxide film 807 except the plugs 810, if the product is thermallyannealed in hydrogen atmosphere after the capacity device has beenformed, the silicon nitride film 808 acts as a barrier for hydrogen toreach layers on which transistors are formed. As a result, performanceof transistors and reliability for transistors are deteriorated, and acharacteristic of transistors is not uniformized.

SUMMARY OF THE INVENTION

In view of the above-mentioned problems in a conventional semiconductormemory device, it is an object of the present invention to provide asemiconductor device and a method of fabricating the same both of whichare capable of avoiding a capacitive film composed of metal oxide frombeing degraded even if a capacity device is thermally annealed inhydrogen atmosphere.

In one aspect of the present invention, there is provided asemiconductor device including (a) a semiconductor substrate, (b) acapacity device, (c) an interlayer insulating layer formed between thesemiconductor substrate and the capacity device for electricallyisolating them with each other, the interlayer insulating layer beingformed therethrough with a contact hole below the capacity device, (d) acontact plug composed of an electrically conductive material and formedin the contact hole, (e) a film composed of a material through whichhydrogen is not allowed to pass, the film entirely covering both thecapacity device and the contact plug therewith.

In accordance with the above-mentioned semiconductor device, both thecapacity device which may include a capacitive film composed of metaloxide, and the contact plug electrically connecting the capacity deviceto the semiconductor substrate are entirely covered with a film composedof a material through which hydrogen is not allowed to pass. Hence, itis possible to prohibit hydrogen to reach the capacitive film.

There is further provided a semiconductor device including (a) asemiconductor substrate, (b) a capacity device, (c) an interlayerinsulating layer formed between the semiconductor substrate and thecapacity device for electrically isolating them with each other, theinterlayer insulating layer being formed therethrough with a contacthole below the capacity device, (d) a contact plug composed of anelectrically conductive material and formed in the contact hole, (e) afirst film composed of a first material through which hydrogen is notallowed to pass, and formed between the interlayer insulating layer andthe capacity device, (f) a second film composed of a second materialthrough which hydrogen is not allowed to pass, and formed on an innerwall of the contact hole, (g) a third film composed of a third materialthrough which hydrogen is not allowed to pass, and formed to cover anupper surface of the capacity device therewith, and (h) a fourth filmcomposed of a fourth material through which hydrogen is not allowed topass, and formed to cover a side surface of the capacity devicetherewith.

It is preferable that the first, second, third, and fourth materials arethe same. The first, second, third, and fourth materials are preferablynitride, and more preferably silicon nitride.

It is preferable that the capacity device includes a capacitive filmcomposed of tantalum oxide. As an alternative, the capacity device mayinclude a capacitive film composed of high-dielectric or ferroelectricsubstance.

It is preferable that the contact hole electrically connects thecapacity device to a source or drain region formed in the semiconductorsubstrate.

The semiconductor device may further include an upper electrode to beelectrically connected to an external wiring, in which case, the upperelectrode is located remote from the capacity device.

In another aspect of the present invention, there is provided a methodof fabricating a semiconductor device, including the steps of (a)forming a multi-layered interlayer insulating film on a semiconductorsubstrate, the multi-layered interlayer insulating film including afirst film, as an uppermost film, composed of a first material throughwhich hydrogen is not allowed to pass, (b) forming a contact holethrough the multi-layered interlayer insulating film to thesemiconductor substrate, (c) forming a second film on an inner wall ofthe contact hole, the second film being composed of a second materialthrough which hydrogen is not allowed to pass, (d) forming a plug layerin the contact hole, the plug layer being composed of an electricallyconductive material, (e) forming a capacity device over the contact holein such a manner that the capacity device is more extensive than across-section of the contact hole, (1) forming a third film on thecapacity device in such a manner that an end surface of the third film,a side surface of the capacity device, and the first film are exposed,the third film being composed of a third material through which hydrogenis not allowed to pass, and (g) forming a fourth film covering both theend surface of the third film and the side surface of the capacitydevice therewith, the fourth film being composed of a fourth materialthrough which hydrogen is not allowed to pass.

In accordance with the above-mentioned method, it is possible to cover acapacity device with the first to fourth films in the same number ofphotolithography steps as the number of photolithography steps in aconventional method.

For instance, the step (c) may include (c-1) forming the second filmover the semiconductor substrate so that an inner wall of the contacthole is covered with the second film, and (c-2) etching the second filmback so that only a portion of the second film deposited on thesemiconductor substrate is removed.

The step (e) may include (e-1) forming a lower electrode on thesemiconductor substrate over the plug layer in such a manner that thelower electrode is more extensive than a cross-section of the contacthole, (e-2) forming a capacitive film entirely covering the lowerelectrode therewith and further covering the first film therewith, and(e-3) forming an upper electrode over the capacitive film, the thirdfilm being formed on the capacitive film.

The step (g) may include (g-1) depositing the fourth film over thecapacity device and the first film, and (g-2) etching the fourth andfirst films so that an upper surface and the end surface of the thirdfilm, and the side surface of the capacity device are covered with thefourth film.

There is further provided a method of fabricating a semiconductordevice, including the steps of (a) forming a multi-layered interlayerinsulating film on a semiconductor substrate, the multi-layeredinterlayer insulating film including a first film, as an uppermost film,composed of a first material through which hydrogen is not allowed topass, (b) forming a plurality of contact holes in a row through themulti-layered interlayer insulating film to the semiconductor substrate,(c) forming a second film on an inner wall of the contact hole, thesecond film being composed of a second material through which hydrogenis not allowed to pass, (d) forming a plug layer in the contact hole,the plug layer being composed of an electrically conductive material,(e) forming a lower electrode on the semiconductor substrate over theplug layer in such a manner that the lower electrode is more extensivethan a cross-section of the contact hole, (f) forming a capacitive filmentirely covering the lower electrode therewith and further covering thefirst film therewith, (g) forming an upper electrode over the capacitivefilm, (h) forming a third film on the upper electrode, (i) etching thethird film in such a manner that an end surface of the third film, aside surface of the upper electrode, a side surface of the capacitivefilm, and the first film are exposed, and that the upper electrode isco-owned by a plurality of the lower electrodes, the third film beingcomposed of a third material through which hydrogen is not allowed topass, and 0) forming a fourth film covering both the end surface of thethird film and the side surface of the capacity device therewith, thefourth film being composed of a fourth material through which hydrogenis not allowed to pass.

In still another aspect of the present invention, there is provided asemiconductor memory device comprising a plurality of semiconductordevices each including a transistor and a capacity device, each of thesemiconductor devices being fabricated in accordance with theabove-mentioned method.

It is preferable that the semiconductor devices are arranged in a grid.

It is also preferable that a contact hole for electrically connectingthe semiconductor memory device to an external wiring layer is formedoutside the capacity device or a region where the semiconductor devicesare arranged. In accordance with this embodiment, it is no longernecessary to form a contact hole, which electrically connects a capacitydevice or an upper electrode of a capacity device connected totransistors to an external wiring layer, in the vicinity of the capacitydevice. That is, if a contact hole connecting an upper electrode to anexternal wiring layer were formed in the vicinity of a capacity device,hydrogen would readily diffuse into the capacity device through thecontact hole during thermal annealing in hydrogen atmosphere. To thecontrary, by positioning a contact hole remote from a capacity device,it would be possible to avoid degradation of a capacity device.

The above and other objects and advantageous features of the presentinvention will be made apparent from the following description made withreference to the accompanying drawings, in which like referencecharacters designate the same or similar parts throughout the drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a cross-sectional view of a conventional semiconductor memorydevice.

FIG. 2 is a cross-sectional view of a semiconductor device in accordancewith the first embodiment of the present invention.

FIG. 3 is a plan view illustrating an upper electrode of capacitydevices, and an external wiring layer.

FIGS. 4A to 4J are cross-sectional views of a semiconductor device inaccordance with the first embodiment, each illustrating respective stepof a method of fabricating the same.

FIG. 5 is a cross-sectional view illustrating a plug.

FIG. 6 is a cross-sectional view of a semiconductor device in accordancewith the second embodiment of the present invention.

FIGS. 7A to 7F are cross-sectional views of a semiconductor device inaccordance with the second embodiment, each illustrating respective stepof a method of fabricating the same.

FIGS. 8A to 8D are perspective views illustrating a semiconductor devicein accordance with the third embodiment, each illustrating respectivestep of a method of fabricating the same.

DESCRIPTION OF THE PREFERRED EMBODIMENTS

[First Embodiment]

FIG. 2 illustrates a semiconductor device in accordance with the firstembodiment. The illustrated semiconductor device comprises a siliconsubstrate 101, a capacity device 100, an interlayer insulating layer 103formed between the silicon substrate 101 and the capacity device 100 forelectrically isolating them with each other, and formed therethroughwith a contact hole 105 below the capacity device 100, a contact plug107 composed of an electrically conductive material and filled in thecontact hole 105, a first silicon nitride film 104 formed between theinterlayer insulating layer 103 and the capacity device 100, a secondsilicon nitride film 106 formed on an inner wall of the contact hole105, a third silicon nitride film 113 formed to cover an upper surfaceof the capacity device 100 therewith, and a fourth silicon nitride film114 formed to cover a side surface of the capacity device 100 therewith.

The capacity device 100 is comprised of a first layer 108 composed oftitanium silicide (MiSi₂) and formed on the first silicon nitride film104 entirely covering the contact hole 105 therewith, a second layer 109composed of titanium nitride and formed on the first layer 108, a lowerelectrode layer 110 formed on the second layer 109, a capacitive film111 entirely covering the first layer 108, the second layer 109, and thelower electrode 110 therewith, and an upper electrode layer 112 coveringthe capacitive film 111 therewith.

The capacity device 100 is spaced away from the silicon substrate 101through the first silicon nitride film 104 and the interlayer insulatingfilm 103 composed of silicon dioxide, but is electrically connected tothe silicon substrate 101 through the contact hold 105 filled with theplug 107. The first silicon nitride film 104 covering a lower surface ofthe capacity device 100 therewith prevents hydrogen from passing throughthe lower electrode 110, and thereby prevents the capacitive film 111from being degraded. When the capacitive film 111 is composed of metaloxide, the first silicon nitride film 104 also ensures to preventgeneration of oxygen caused by hydrogen reduction. If an oxygen gas isgenerated by reduction, the oxygen gas may cause layers of the capacitydevice 100 to peel off.

The contact hole 105 reaches the silicon substrate 101 at a region 102into which impurities are heavily doped in order to reduce a junctionresistance. The contact hole 105 may be designed to reach a metal wiringlayer (not illustrated) in place of the silicon substrate 101.

The second silicon nitride film 106 covers an inner wall of the contacthole 105 therewith. The second silicon nitride film 106 formed on aninner wall of the contact hole 105 prevents hydrogen diffusing into thesilicon dioxide film 103 around the capacity device 100 from penetratinginto the contact hole 105 through a peripheral surface thereof

The plug 107 filling the contact hole 105 therewith is composed ofpolysilicon or metal such as tungsten. When the contact hole 105 isdesigned to reach the silicon substrate 101 (not a metal wiring layer),there may be formed a layer at a bottom of the contact hole 105 whichlayer is composed of metal silicide or a material acting as a diffusionbarrier for semiconductor elements. For instance, such a layer may havea two-layered structure comprised of a titanium silicide layer and atitanium nitride layer.

The lower electrode 110 of the capacity device 100 is formed over thecontact hole 105. When the contact hole 105 is filled with silicon,there are formed the second layer 109 composed of titanium nitride andacting as a diffusion barrier to silicon, and the first layer 108composed of titanium silicide (TiSi₂) for reducing a junctionresistance. The lower electrode 110 making contact with the capacitivefilm 111 is preferably composed of Pt, Ru, or Ir. As an alternative, thelower electrode 110 may be composed of a metal oxide having a lowelectric resistance such as RuO₂ and IrO₂, or may have a multi-layeredstructure including a layer composed of such a metal oxide.

The lower electrode 110 is covered with the capacitive film 111 andfurther with the upper electrode layer 112. The capacitive film 111 iscomposed of Ta₂O₅, for instance. As an alternative, the capacitive film111 may be composed of high-dielectric or ferroelectric substance suchas (Ba, Sr)TiO₃ and SrTiO₃. The upper electrode layer 112 may becomposed of Pt, Au, Ru or TiN.

The upper electrode layer 112 is covered at an upper surface thereofwith the third silicon nitride film 113. The capacitive film 111 and theupper electrode layer 112 are covered at end surfaces thereof with thefourth silicon nitride film 114.

FIG. 3 illustrates a positional relationship between an upper electrodeand an external wiring layer.

As illustrated in FIG. 3, an upper electrode layer 202 connects thecapacitor devices 201 to an external wiring contact 203, which is acontact through the third silicon nitride film 113, and is notpositioned above capacity devices 201, but positioned remote from eachof the capacity devices 201 or a region where a plurality of thecapacity devices 201 are arranged. If the upper electrode layer 202 isformed just above the capacity device 201, the third silicon nitridefilm 113 has to be formed with a hold for connecting to the upperelectrode 202, which would cause a problem that hydrogen could readilypenetrate the capacity device 201 during thermal annealing in hydrogenatmosphere. It is possible to prevent degradation of a capacity deviceby covering a capacity device at upper and side surface thereof with asilicon nitride film, and further by positioning the contact 203 betweenthe upper electrode 202 and an external wiring layer (not shown) so thatthe contact 203 is remote from a capacity device or capacity devices.

As explained so far, the semiconductor device in accordance with thefirst embodiment makes it possible to avoid degradation of a capacitydevice caused by hydrogen by forming silicon nitride films at upper,side and lower surfaces of the capacity device, and an inner wall of acontact hole in connection with a lower surface of the capacity device.

Hereinbelow is explained a method of fabricating the semiconductordevice illustrated in FIGS. 2 and 3, with reference to FIGS. 4A to 4J.

First, as illustrated in FIG. 4A, there is prepared a p-type siliconsubstrate 301. There may be prepared a silicon substrate on which aninsulating film and a metal wiring layer are formed, in place of thep-type silicon substrate 301. Insulating films are formed at a surfaceof the p-type silicon substrate 301 in selected regions to therebydefine device formation regions therebetween. Regions into whichimpurities are heavily doped are also separated into several sectionswhen device formation regions are defined.

Then, a multi-layered interlayer insulating film is formed on the p-typesilicon substrate 301. The multi-layered interlayer insulating film hasa first silicon nitride film as an uppermost layer. In this embodiment,the multi-layered interlayer insulating film is comprised of a silicondioxide film 302 and a first silicon nitride film 303. Then, asillustrated in FIG. 4A, the silicon dioxide film 302 and the firstsilicon nitride film 303 are formed in a selected region with a contacthole 304 by means of photolithography and dry etching.

Then, as illustrated in FIG. 4B, a second silicon nitride film 305 isformed all over the produce by chemical vapor deposition (CVD). Then, asillustrated in FIG. 4C, the thus formed second silicon nitride film 305is etched back, resulting in that a sidewall composed of silicon nitrideis formed on an inner wall of the contact hole 304.

Then, as illustrated in FIG. 4D, the electrically conductive plug 306 isformed in the contact hole 304. Specifically, a polysilicon film isdeposited all over the product by CVD so that the contact hole 304 isfilled with polysilicon, and then the polysilicon film located on thefirst silicon nitride film 303 is etched back. As an alternative, theremay be employed a mask for removing unnecessary portions of thepolysilicon film. Impurities may be introduced into the polysilicon filmwhen the polysilicon film is formed by CVD, to thereby cause the plug306 to have the same electrical conductivity as that of a highlyimpurity-doped region having been in advance formed in the siliconsubstrate 301, which ensures reduction of a parasitic resistance at acontact through which the plug 306 makes contact with the siliconsubstrate 301.

As an alternative, impurities may be introduced into the polysiliconfilm by ion-implantation after the formation thereof. As illustrated inFIG. 4E, if a metal wiring layer is exposed at a bottom of the contacthole 304, there may be formed a silicon-diffusion barrier layer over theproduce in order to prevent reaction between silicon and the metalwiring layer. For instance, such a silicon-diffusion barrier layer maybe a titanium nitride (TiN) layer or a titanium silicide 307/titaniumnitride 308 (TiSi₂/TiN) layer, as illustrated in FIG. 4E. As analternative, a Ti/TiN film may be first formed over the contact hole304, and then be thermally annealed to thereby turn only an upperportion of the plug 306 into silicide.

The contact hole 304 may be filled with metal such as tungsten. When asubstrate appearing at a bottom of the contact hole 304 is silicon, abarrier layer composed of Ti/TiN may be formed between the substrate anda plug in order to prevent reaction between silicon and metal fillingthe contact hole 304 therewith.

As illustrated in FIG. 5, the plug 306 may be designed to have aprojecting portion 400 beyond an upper surface of the first siliconnitride film 303. The projection portion 400 may be formed by employinga mask to remove a portion of a polysilicon film located on the firstsilicon nitride film 303.

Then, as illustrated in FIGS. 4E and 4F, there is formed a lowerelectrode layer 309 over the silicon-diffusion barrier layer 307 and308. The lower electrode layer 309 is composed of Pt, Ru, Ir, RuO₂ orIrO₂. Thereafter, as illustrated in FIG. 4G, a capacitive insulatingfilm 310, an upper electrode layer 311, and a third silicon nitride film312 are successively formed all over the product.

Then, an unnecessary portion of the capacitive insulating film 310, theupper electrode layer 311, and the third silicon nitride film 312 isetched for removal by using a mask until the first silicon nitride film303 is exposed, as illustrated in FIG. 4H. There may be selectedreactive dry etching or ion milling with inert gas being used.

Then, as illustrated in FIG. 4I, a fourth silicon nitride film 313 isformed all over the product. The fourth silicon nitride film 313 isetched back to thereby form a sidewall covering end surfaces of thecapacitive insulating film 310, the upper electrode layer 311, and thethird silicon nitride film 312 therewith, as illustrated in FIG. 4J.

Then, there is formed an insulating film (not illustrated) all over theproduct for electrically insulating from an external wiring layer. Then,there is formed a second contact hole (not illustrated) throughout theinsulating film to electrically connect the thus fabricated capacitydevice to the external wiring layer.

[Second Embodiment]

FIG. 6 illustrates a semiconductor device in accordance with the secondembodiment of the present invention.

As illustrated in FIG. 6, insulating films 503 are formed at a surfaceof a semiconductor substrate 501 to thereby define device formationregions therebetween. Gate electrodes 505 of field effect transistors(FET) are arranged at a certain interval on a surface of thesemiconductor substrate 501. The semiconductor substrate 501 is formedat a surface thereof with source/drain regions 502 above some of whichare formed the above-mentioned capacity devices 100 illustrated in FIG.2. Elements formed on the insulating films 503 extend perpendicularly toa plane of the drawing.

The semiconductor substrate 501 is composed of p- or n-type silicon. Ifnecessary, a well having certain conductivity may be formed in thesemiconductor substrate 501 by ion-implantation.

The insulating films 503 define device formation regions therebetweenwhere a field effect transistor is formed comprising the gate electrode505, a gate insulating film sandwiched between the gate electrode 505and the semiconductor substrate 501, and the source and drain regions502 around the gate electrode 505. The gate electrode 505 may becomposed of polysilicon into which impurities are introduced, or mayhave a multi-layered structure comprising a polysilicon layer into whichimpurities are introduced, a metal silicide layer, and a polysiliconlayer. A bit line or a signal line 506 is formed on the source/drainregion 502.

Over the field effect transistor are formed an interlayer insulatingfilm 507 and a first silicon nitride film 508. There are formed firstcontact holes 509 throughout the first silicon nitride film 508 and theinterlayer insulating film 507 for electrically connecting capacitydevices to the source/drain regions 502 of the transistors.

A second silicon nitride film 510 is formed on an inner wall of each ofthe contact holes 509.

A plug 511 composed of metal such as polysilicon and tungsten is formedin each of the contact holes 511. Similarly to the first embodiment,when the contact hole 509 reaches the semiconductor substrate 501, it ispreferable to form a diffusion barrier layer at a bottom of the contacthole 509 in order to prevent diffusion of metal silicide andsemiconductor atoms. For instance, such a diffusion barrier layer may bedesigned to have a two-layered structure of a titanium silicide layerand a titanium nitride layer.

A lower or storage electrode 514 of the capacity device is formed overthe contact hole 509. When the contact hole 509 is filled with silicon,there are formed a second layer 513 composed of titanium nitride andacting as a diffusion barrier to silicon, and a first layer 512 composedof titanium silicide (TiSi₂) for reducing a junction resistance. Thelower electrode 514 making contact with a later mentioned capacitivefilm 515 is preferably composed of Pt, Ru, or Ir. As an alternative, thelower electrode 514 may be composed of a metal oxide having a lowelectric resistance such as RuO₂ and IrO₂, or may have a multi-layeredstructure including at least a layer composed of such a metal oxide.

The lower electrode 514 is covered with a capacitive film 515 andfurther with an upper electrode layer 516. The capacitive film 515 iscomposed of tantalum oxide, Ta₂O₅, for instance. As an alternative, thecapacitive film 515 may be composed of high-dielectric or ferroelectricsubstance such as (Ba, Sr)TiO₃ and SrTiO₃. The upper electrode layer 516may be composed of Pt, Au, Ru or TiN.

The upper electrode layer 516 is covered at an upper surface thereofwith a third silicon nitride film 517. The capacitive film 515 and theupper electrode layer 516 are covered at end surfaces thereof with afourth silicon nitride film 518.

An interlayer insulating film 519 is formed all over the product forelectrically insulating from an external wiring, and second contactholes (not illustrated) are formed throughout the interlayer insulatingfilm 519 for electrically connecting the external wiring to the capacitydevice. The location of the second contact holes is the same as thelocation having been explained with reference to FIG. 3.

A method of fabricating a semiconductor device in accordance with theabove-mentioned second embodiment is almost the same as the methodhaving been explained with reference to FIGS. 4A to 4J. Hereinbelow isexplained a specific embodiment of a method of fabricating asemiconductor device in accordance with the second embodiment.

FIGS. 7A to 7F illustrates a method of fabricating a semiconductordevice in accordance with the second embodiment. As illustrated in FIG.7A, silicon dioxide films as insulating films 602 are formed at asurface of a p-type silicon substrate 601 by local oxide of silicon(LOCOS) process, improved LOCOS process, or a groove-separation process,to thereby define device formation regions between the insulating films602. The silicon dioxide films 602 has a thickness of 350 nm. Below theinsulating films 602 are formed channel stoppers 603.

Then, a silicon dioxide film as a gate oxide film is grown by athickness of 10 nm. A polysilicon film of which a gate electrode 605will be made is formed over the product by a thickness of 200 nm. Then,the polysilicon film is patterned by photolithography and dry etching tothereby define the gate electrodes 605. Around the gate electrodes 605are formed sidewall films 606. The gate electrode 605 may be designed tohave a multi-layered structure comprising either a metal layer and apolysilicon layer, or a metal silicon layer and a polysilicon layer, tothereby reduce a layer resistance of the gate electrode 605, whichensures enhancement of circuit performance.

The semiconductor substrate 601 is ion-implanted with phosphorus ions orarsenic ions to thereby form source/drain regions 604. A bit line 607 isformed on the source/drain region 604. The bit line 607 is composed ofpolysilicon or metal silicide.

Then, as illustrated in FIG. 7B, an interlayer insulating film is formedover the product. The interlayer insulating film is comprised of asilicon dioxide film 608 and a first silicon nitride film 609. Thesilicon dioxide film 608 is formed by CVD where silane or TEOS is usedas a process gas. The first silicon nitride film 609 is formed by CVD bya thickness of 200 nm. The interlayer insulating film is formed atselected regions with contact holes 610 by means of photolithography anddry etching.

Then, as illustrated in FIG. 7C, a second silicon nitride film 611 isformed all over the product by a thickness of 50 nm, followed byanisotropic dry etching to thereby etch back the second silicon nitridefilm 611. As a result, the second silicon nitride film 611 is formedonly on an inner wall of each of the contact holes 610.

Then, a polysilicon film is formed all over the product. The polysiliconfilm is etched back to thereby form a plug layer 612 in each of thecontact holes 610. It is preferable that the polysilicon film is formedby CVD where gaseous impurities such as phosphine gas is simultaneouslyused, to thereby introduce impurities such as phosphorus into thepolysilicon film for reducing a resistance of the plug layer 612.

As a diffusion barrier layer to silicon, a titanium silicide layer 613and a titanium nitride layer 614 are formed on the first silicon nitridefilm 609 above each of the contact holes 610. Then, a lower electrodelayer 615 composed of Ru is formed over the titanium nitride layer 614by a thickness of 200 nm. The lower electrode layer 614 is preferablycomposed of a metal such as Ru which has electrical conductivity even ifoxidized. However, reaction between materials of which the plug layer612 and the lower electrode layer 615 are composed is to be taken intoconsideration. If the plug layer 612 is composed of silicon, siliconreacts with a material of which the lower electrode layer 615 iscomposed, to thereby not only produce silicide, but also pass throughthe lower electrode layer 615 and react with a later mentionedcapacitive film with the result of deterioration of performance of acapacitive film.

As illustrated in FIG. 7D, the lower electrode layer 615 is patterned bymeans of either photolithography and dry etching or ion milling tothereby define lower electrodes.

Then, as illustrated in FIG. 7E, a capacitive film composed of BST isformed all over the product by a thickness of 30 nm by MO-CVD or thermalCVD, for instance. When the lower electrodes 615 are planar, thecapacitive film 616 may be formed by sputtering or Sol-Gel method.Subsequently, an upper electrode layer 617 composed of Pt is formed overthe product by sputtering by a thickness of 10 nm. The upper electrodelayer 617 may be composed of Ru, W. or TiN.

A third silicon nitride film 618 is formed over the upper electrodelayer 617 by CVD by a thickness of 100 nm. Then, the capacitive film616, the upper electrode layer 617, and the third silicon nitride film618 are patterned by means of photolithography and dry etching, asillustrated in FIG. 7E.

Then, as illustrated in FIG. 4F, a fourth silicon nitride film 619 isformed all over the product by a thickness of 100 nm, followed byetching back until the interlayer insulating film 608 is exposed. Thus,a capacity device is covered at a side surface thereof with the fourthsilicon nitride film 619. Then, an interlayer insulating film 620composed of BPSG is formed all over the product by a thickness of 500nm. The interlayer insulating film 620 may be formed of a silicondioxide (SiO₂) film using TEOS as a process gas.

Then, there are formed contact holes (not illustrated) throughout theinterlayer insulating film 620 for electrically connecting an externalwiring to the upper electrode 617 of the capacity device. The locationof the contact holes is determined as having been explained withreference to FIG. 3.

[Third Embodiment]

FIGS. 8A to 8D illustrate a semiconductor device in accordance with thethird embodiment where a plurality of capacity devices is arranged on asemiconductor substrate. Hereinbelow is explained a method offabricating a semiconductor device in accordance with the thirdembodiment.

An interlayer insulating film 701 is formed on a semiconductor substrate(not illustrated). A semiconductor substrate on which a wiring layer isformed may be used instead. The semiconductor substrate is covered at anupper surface thereof with a first silicon nitride film 702. A pluralityof contact holes 703 are formed throughout the first silicon nitridefilm 702 and the interlayer insulating film 701. Each of the contactholes 703 is filled with a plug layer 705. A second silicon nitride film704 is formed on an inner wall of each of the contact holes 703.

A titanium silicide (TiSi₂) film 706, a titanium nitride (TiN) film 707,a lower electrode layer 708, a capacitive film 709, an upper electrodelayer 710, and a third silicon nitride film 711 are formed in the sameprocess as the process having been explained with reference to FIGS. 7Ato 7F.

A plurality of the lower electrodes 708 of the capacity devices isregularly arranged on the interlayer insulating film 701. However, itshould be noted that the capacitive film 709, the upper electrode layer710, and the third silicon nitride film 711 are shared by a plurality ofthe capacity devices, as illustrated in FIG. 8A.

Then, the third silicon nitride film 711, the upper electrode 710, thecapacitive layer 709, and the first silicon nitride film 702 arepartially removed in a selected region in a certain direction byphotolithography and dry etching, as illustrated in FIG. 8B. It is notnecessary to completely remove the first silicon nitride film 702. Dryetching may be carried out at least until a surface of the first siliconnitride film 702 is exposed.

Then, a fourth silicon nitride film 712 is formed all over the product,as illustrated in FIG. 8C. Thereafter, the fourth silicon nitride film712 is etched back until the interlayer insulating film or silicondioxide film 701 is exposed, as illustrated in FIG. 8D. Thus, thecapacity devices arranged in a row are covered at end surfaces thereofwith the fourth silicon nitride film 712.

As having been described in connection with the preferred embodiments,in accordance with the present invention, a capacity device having acapacitive film composed of metal oxide readily reduced by hydrogen isentirely covered with first to fourth silicon nitride films. Hence, itis possible to avoid the capacitive film from being reduced, whichensures that the capacitive film is not deteriorated, and that there ispresented a high-performance capacity device having a low leakagecurrent and a high capacity.

While the present invention has been described in connection withcertain preferred embodiments, it is to be understood that the subjectmatter encompassed by way of the present invention is not to be limitedto those specific embodiments. On the contrary, it is intended for thesubject matter of the invention to include all alternatives,modifications and equivalents as can be included within the spirit andscope of the following claims.

The entire disclosure of Japanese Patent Application No. 9-224950 filedon Aug. 21, 1997 including specification, claims, drawings and summaryis incorporated herein by reference in its entirety.

What is claimed is:
 1. A semiconductor device comprising: (a) asemiconductor substrate; (b) a capacity device; (c) an interlayerinsulating layer formed between said semiconductor substrate and saidcapacity device for electrically isolating them from each other, saidinterlayer insulating layer being formed with a contact hole below saidcapacity device; (d) a contact plug composed of an electricallyconductive material and formed in said contact hole; (e) a plurality offilm layers each composed of a material through which hydrogen is notallowed to pass, said film layers entirely covering a top surface, aside surface and a bottom surface of said capacity device and sides ofsaid contact plug.
 2. The semiconductor device as set forth in claim 1,wherein said material through which hydrogen is not allowed to pass ofwhich said film layers are composed includes a nitride.
 3. Thesemiconductor device as set forth in claim 1, wherein said materialthrough which hydrogen is not allowed to pass of which said film layersare composed includes silicon nitride.
 4. The semiconductor device asset forth in claim 1, wherein said capacity device includes a capacitivefilm including tantalum oxide.
 5. The semiconductor device as set forthin claim 1, wherein said capacity device includes a capacitive filmincluding a high dielectric or ferroelectric substance.
 6. Thesemiconductor device as set forth in claim 1, wherein said contact holeelectrically connects at least one electrical contact of said capacitydevice to a source or drain region formed in said semiconductorsubstrate.
 7. A semiconductor device comprising: (a) a semiconductorsubstrate; (b) a capacity device; (c) an interlayer insulating layerformed between said semiconductor substrate and said capacity device forelectrically isolating them from each other, said interlayer insulatinglayer being formed therethrough with a contact hole below said capacitydevice; (d) a contact plug composed of an electrically conductivematerial and formed in said contact hole; (e) a film composed of amaterial through which hydrogen is not allowed to pass, said filmentirely covering both said capacity device and said contact plugtherewith, further comprising an upper electrode to be electricallyconnected to an external wiring by a contact, said upper electrodecontact to said external wiring being located remote from said capacitydevice.
 8. A semiconductor device comprising: (a) a semiconductorsubstrate; (b) a capacity device; (c) an interlayer insulating layerformed between said semiconductor substrate and said capacity device forelectrically isolating them from each other, said interlayer insulatinglayer being formed therethrough with a contact hole below said capacitydevice; (d) a contact plug composed of an electrically conductivematerial formed to be disposed substantially in said contact hole; (e) afirst film composed of a first material through which hydrogen is notallowed to pass, and formed between said interlayer insulating layer andsaid capacity device; (f) a second film composed of a second materialthrough which hydrogen is not allowed to pass, and formed upon an innerwall of said contact hole; (g) a third film composed of a third materialthrough which hydrogen is not allowed to pass, and formed to cover anupper surface of said capacity device therewith; and (h) a fourth filmcomposed of a fourth material through which hydrogen is not allowed topass, and formed to cover a side surface of said capacity devicetherewith.
 9. The semiconductor device is set forth in claim 8, whereinsaid first, second, third, fourth materials are the same.
 10. Thesemiconductor device is set forth in claim 9, wherein said first,second, third, fourth materials through which hydrogen is not allowed topass include a nitride.
 11. The semiconductor device is set forth inclaim 9, wherein said first, second, third, fourth materials throughwhich hydrogen is not allowed to pass include at least a siliconnitride.
 12. The semiconductor device as set forth in claim 8, whereinsaid capacity device includes a capacitive film containing tantalumoxide.
 13. The semiconductor device as set forth in claim 8, whereinsaid capacity device includes a capacitive film containing a highdielectric or ferroelectric substance.
 14. The semiconductor device asset forth in claim 8, wherein said contact hole electrically connects atleast one electrical contact of said capacity device to a source ordrain region formed in said semiconductor substrate.
 15. A semiconductordevice comprising: (a) a semiconductor substrate; (b) a capacity device;(c) an interlayer insulating layer formed between said semiconductorsubstrate and said capacity device for electrically isolating them fromeach other, said interlayer insulating layer being formed therethroughwith a contact hole below said capacity device; (d) a contact plugcomposed of an electrically conductive material and formed in saidcontact hole; (e) a first film composed of a first material throughwhich hydrogen is not allowed to pass, and formed between saidinterlayer insulating layer and said capacity device; (f) a second filmcomposed of a second material through which hydrogen is not allowed topass, and formed upon an inner wall of said contact hole; (g) a thirdfilm composed of a third material through which hydrogen is not allowedto pass, and formed to cover an upper surface of said capacity deviceand therewith; and (h) a fourth film composed of a fourth materialthrough which hydrogen is not allowed to pass, and formed to cover aside surface of said capacity device therewith, further comprising anupper electrode to be electrically connected to an external wiring by acontact, said upper electrode contact to said external wiring beinglocated remote from said capacity device.
 16. A semiconductor memorydevice comprising a plurality of semiconductor devices each including atransistor and a capacity device, each of said semiconductor devicesbeing fabricated in accordance with a method of: (a) forming amulti-layered interlayer insulating film on a semiconductor substrate,said multilayered interlayer insulating film including a first film, asan uppermost film, composed of a first material through which hydrogenis not allowed to pass; (b) forming a contact hole through saidmulti-layered interlayer insulating film to said semiconductorsubstrate; (c) forming a second film on an inner wall of said contacthole, said second film being composed of a second material through whichhydrogen is not allowed to pass; (d) forming a plug layer in saidcontact hole, said plug layer being composed of an electricallyconductive material; (e) forming a capacity device over said contacthole in such a manner that said capacity device has a larger area than across-section of said contact hole; (f) forming a third film on saidcapacity device in such a manner that an end surface of said third film,a side surface of said capacity device, and said first film are exposed,said third film being composed of a third material through whichhydrogen is not allowed to pass; and (g) forming a fourth film coveringboth said end surface of said third film and said side surface of saidcapacity device therewith, and said fourth film being composed of afourth material through which hydrogen is not allowed to pass.
 17. Thesemiconductor memory device as set forth in claim 16, wherein saidsemiconductor devices are arranged in a grid.
 18. The semiconductormemory device as set forth in claim 16, wherein a contact hole forelectrically connecting said semiconductor memory device to an externalwiring layer is formed outside said capacity device or a region wheresaid semiconductor devices are arranged.